The next meeting of the SIG will be Friday February 24th at 2 PM. The theme will be New Developments in STEM Publishing. The speakers will be:
Ruth Wolfish of IEEE
Karen Berryman of INSPEC
To register go to http://www.metro.org/en/cev/148
There is no charge for this meeting
For further information please contact Bruce Slutsky at slutsky@adm.njit.edu or 973-642-4950
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